XQR4062XL-2CB228I ApplicationField
-Cloud Computing
-5G Technology
-Consumer Electronics
-Medical Equipment
-Wireless Technology
-Industrial Control
-Artificial Intelligence
-Internet of Things
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XQR4062XL-2CB228I FAQ
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A: Enter the “XQR4062XL-2CB228I” keyword in the search box of the website, or find these through the Download Channel or FPGA Forum .
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A: In FPGA/CPLD design tools, Xilinx’s Vivado Design Suite is easy to use, it is very user-friendly in synthesis and implementation, and it is easier to use than ISE design tools; The specific choice depends on personal habits and functional requirements to specifically select a more suitable match. You can search and download through the FPGA resource channel.
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XQR4062XL-2CB228I Features
Low soft upset rate
Abundant flip-flops
Low power segmented routing architecture
12 mA sink current per output
Dedicated high-speed carry logic
Internal 3-state bus capability
Unlimited reprogrammability
Programmable input pull-up or pull-down resistors
System featured FPGAs
Program verification
Advanced 0.35µ process
Configured by loading binary file
Flexible function generators
Internal node observability
synchronous write option
Eight global low-skew clock or signal distribution networks
Readback capability
Guaranteed total ionizing dose
dual-port RAM option
SelectRAM memory: on-chip ultra-fast RAM with
Systems-oriented features
Available in -3 speed
Latch-up immune
IEEE 1149.1-compatible boundary scan logic support
Hierarchy of interconnect lines
System performance beyond 60 MHz
Guaranteed to meet full electrical specifications over –55°C to +125°C
Individually programmable output slew rate
Wide edge decoders on each edge
Development system runs on most common computer platforms
Radiation-hardened FPGAs for space and satellite applications
Processed on Xilinx QML line
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XQR4062XL-2CB228I Overview
Power-On Power Supply Requirements
Xilinx XQR4062XL-2CB228I FPGAs require a minimum rated power supply current
capacity to insure proper initialization, and the power supply
ramp-up time does affect the current required. A fast
ramp-up time requires more current than a slow ramp-up
time. The slowest ramp-up time is 50 ms. Current capacity
is not specified for a ramp-up time faster than 2 ms. The current capacity varies linealy with ramp-up time, e.g., an
XQR4036XL with a ramp-up time of 25 ms would require a
capacity predicted by the point on the straight line drawn
from 1A at 120 µs to 500 mA at 50 ms at the 25 ms time
mark. This point is approximately 750 mA .XQR4062XL-2CB228I AC Switching Characteristic Testing of the switching parameters is modeled after testing
methods specified by MIL-M-38510/605. All devices are
100% functionally tested. Internal timing parameters are
derived from measuring internal test patterns. Listed below
are representative values where one global clock input
drives one vertical clock line in each accessible column, and
where all accessible IOB and CLB flip-flops are clocked by
the global clock net.
When fewer vertical clock lines are connected, the clock distribution is faster; when multiple clock lines per column are driven from the same global clock, the delay is longer. For
more specific, more precise, and worst-case guaranteed
data, reflecting the actual routing structure, use the values
provided by the static timing analyzer (TRCE in the Xilinx
Development System) and back-annotated to the simulation
netlist. These path delays, provided as a guideline, have
been extracted from the static timing analyzer report. All
timing parameters assume worst-case operating conditions
(supply voltage and junction temperature)XQR4062XL-2CB228I CLB Switching Characteristic Guidelines
Testing of switching parameters is modeled after testing
methods specified by MIL-M-38510/605. All devices are
100% functionally tested. Internal timing parameters are
derived from measuring internal test patterns. Listed below
are representative values. For more specific, more precise,
and worst-case guaranteed data, use the values reported
by the static timing analyzer (TRCE in the Xilinx Development System) and back-annotated to the simulation netlist.
All timing parameters assume worst-case operating conditions (supply voltage and junction temperature). Values
apply to all XQR4000XL devices and expressed in nanoseconds unless otherwise noted.
XQR4062XL-2CB228I Tags
XQR4062XL-2CB228I Datasheet PDF
Xilinx XQR4062XL
QPRO XQR4000XL Radiation Hardened FPGAs XQR4062XL
Xilinx QPRO XQR4000XL Radiation Hardened FPGAs development board
QPRO XQR4000XL Radiation Hardened FPGAs starter kit
XQR4062XL reference design
XQR4062XL development board
QPRO XQR4000XL Radiation Hardened FPGAs evaluation kit
XQR4062XL-2CB228I TechnicalAttributes
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